Probe Station-sawan实验室

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Probe Station

Introduction

High-precision probe system that enables testing at multiple temperatures. Excellent measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment, at a temperature range from -60°C to 300°C.

Characteristics

Device Name	Probe Station
Model	Cascade Summit11K
Characteristics	- Re-configurable for DC, RF, mmW, FA, WLR and more - Thermal range: -60˚C to 300˚C available - Upgrade path to meet your future needs - Stable and repeatable measurements over a wide thermal range - Advanced shielding solution - Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology - Advanced EMI-shielding with PureLine with AttoGuard technologies - Best solution for low-noise and 1/f measurements - Minimize AC and spectral noise - Intuitive ergonomic stage controls - Quick, safe, and comfortable wafer access - Easy on-wafer navigation

Device Name

Probe Station

Model

Cascade Summit11K

Characteristics

- Re-configurable for DC, RF, mmW, FA, WLR and more

- Thermal range: -60˚C to 300˚C available

- Upgrade path to meet your future needs

- Stable and repeatable measurements over a wide thermal range

- Advanced shielding solution

- Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology

- Advanced EMI-shielding with PureLine with AttoGuard technologies

- Best solution for low-noise and 1/f measurements

- Minimize AC and spectral noise

- Intuitive ergonomic stage controls

- Quick, safe, and comfortable wafer access

- Easy on-wafer navigation